Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7876118 | Test equipment | Satoshi Iwamoto, Koichi Yatsuka, Toshio Matsuura | 2011-01-25 |
| 7802160 | Test apparatus and calibration method | — | 2010-09-21 |
| 7768255 | Interconnection substrate, skew measurement method, and test apparatus | — | 2010-08-03 |
| 7350123 | Test apparatus, correction value managing method, and computer program | — | 2008-03-25 |
| 6275057 | Semiconductor test system having high frequency and low jitter clock generator | — | 2001-08-14 |