Issued Patents All Time
Showing 26–50 of 118 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8278962 | Transfer circuit, transmitter, receiver and test apparatus | Daisuke Watanabe | 2012-10-02 |
| 8274296 | Test apparatus and electronic device that tests a device under test | Masayuki Kawabata | 2012-09-25 |
| 8270225 | Data receiving circuit | Daisuke Watanabe | 2012-09-18 |
| 8269569 | Test apparatus for digital modulated signal | Daisuke Watanabe | 2012-09-18 |
| 8269553 | Delay circuit | Kazuhiro Yamamoto | 2012-09-18 |
| 8239147 | Test apparatus and manufacturing method | Daisuke Watanabe | 2012-08-07 |
| 8159290 | Test apparatus, demodulation apparatus, test method, demodulation method and electric device | Kazuhiro Yamamoto | 2012-04-17 |
| 8150648 | Timing generator | Daisuke Watanabe | 2012-04-03 |
| 8139953 | Signal transmission device, signal reception device, test module, and semiconductor chip | Daisuke Watanabe | 2012-03-20 |
| 8129857 | Semiconductor circuit | Shoji Kojima | 2012-03-06 |
| 8093918 | Electronic device identifying method and electronic device comprising identification means | Shigetoshi Sugawa, Akinobu Teramoto | 2012-01-10 |
| 8063682 | Semiconductor circuit for performing signal processing | Shoji Kojima | 2011-11-22 |
| 8058648 | Switching device and testing apparatus | — | 2011-11-15 |
| 8031102 | A-D converter | Kazuhiro Yamamoto | 2011-10-04 |
| 7932729 | Test apparatus and test method | Daisuke Watanabe | 2011-04-26 |
| 7911242 | Signal generating apparatus, test apparatus and circuit device | Daisuke Watanabe | 2011-03-22 |
| 7905662 | Connecting device, connecting system, optical waveguide and connecting method | Kazuhiro Fujita, Daisuke Watanabe | 2011-03-15 |
| 7902918 | Demodulation apparatus, test apparatus and electronic device | Kazuhiro Yamamoto | 2011-03-08 |
| 7859444 | D-A converter and D-A converting method | Kazuhiro Yamamoto | 2010-12-28 |
| 7852122 | Transmission circuit for transmitting a differential signal having pulse time larger than a predetermined minimum pulse time and CMOS semiconductor device | Kazuhiro Yamamoto | 2010-12-14 |
| 7847572 | Test system, electronic device, and test apparatus | Daisuke Watanabe | 2010-12-07 |
| 7848828 | Method and apparatus for managing manufacturing equipment, method for manufacturing device thereby | Shigetoshi Sugawa, Akinobu Teramoto | 2010-12-07 |
| 7812595 | Electronic device identifying method | Shigetoshi Sugawa, Akinobu Teramoto | 2010-10-12 |
| 7774081 | Manufacturing system, manufacturing method, managing apparatus, managing method and computer readable medium | Shigetoshi Sugawa, Akinobu Teramoto | 2010-08-10 |
| 7756654 | Test apparatus | Kazuhiro Yamamoto | 2010-07-13 |