Issued Patents 2024
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12066391 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Mark Klare, Cornel Bozdog | 2024-08-20 |
| 11988502 | Characterizing and measuring in small boxes using XPS with multiple measurements | Wei Ti Lee, Laxmi WARAD, Dmitry Kislitsyn, Parker Lund, Benny Tseng +2 more | 2024-05-21 |
| 11906451 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Mark Klare, Cornel Bozdog, Alok Vaid | 2024-02-20 |
| 11874237 | System and method for measuring a sample by x-ray reflectance scatterometry | David A. Reed, Bruno Shueler, Rodney Smedt, Jeffrey T. Fanton | 2024-01-16 |