Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11874237 | System and method for measuring a sample by x-ray reflectance scatterometry | Heath A. Pois, David A. Reed, Bruno Shueler, Rodney Smedt | 2024-01-16 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11874237 | System and method for measuring a sample by x-ray reflectance scatterometry | Heath A. Pois, David A. Reed, Bruno Shueler, Rodney Smedt | 2024-01-16 |