Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165863 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Chris Bevis | 2024-12-10 |
| 11874237 | System and method for measuring a sample by x-ray reflectance scatterometry | Heath A. Pois, David A. Reed, Bruno Shueler, Jeffrey T. Fanton | 2024-01-16 |