Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165863 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | David A. Reed, Bruce H. Newcome, Rodney Smedt, Chris Bevis | 2024-12-10 |
| 11996259 | Patterned x-ray emitting target | David A. Reed, Bruce H. Newcome | 2024-05-28 |