Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165863 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt, Chris Bevis | 2024-12-10 |
| 11996259 | Patterned x-ray emitting target | Bruce H. Newcome, Bruno W. Schueler | 2024-05-28 |
| 11874237 | System and method for measuring a sample by x-ray reflectance scatterometry | Heath A. Pois, Bruno Shueler, Rodney Smedt, Jeffrey T. Fanton | 2024-01-16 |