Issued Patents 2024
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12158437 | XPS metrology for process control in selective deposition | Charles Thomas Larson, Kavita Shah | 2024-12-03 |
| 12066391 | Method and system for non-destructive metrology of thin layers | Heath A. Pois, Mark Klare, Cornel Bozdog | 2024-08-20 |
| 11997932 | Resistive switching memory having confined filament formation and methods thereof | Sundar Narayanan, Wee Chen Gan, Natividad Vasquez | 2024-05-28 |
| 11988502 | Characterizing and measuring in small boxes using XPS with multiple measurements | Heath A. Pois, Laxmi WARAD, Dmitry Kislitsyn, Parker Lund, Benny Tseng +2 more | 2024-05-21 |
| 11906451 | Method and system for non-destructive metrology of thin layers | Heath A. Pois, Mark Klare, Cornel Bozdog, Alok Vaid | 2024-02-20 |