Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12158437 | XPS metrology for process control in selective deposition | Charles Thomas Larson, Wei Ti Lee | 2024-12-03 |
| 11895205 | Systems and methods for restricting generation and delivery of insights to second data source providers | Oleg Rogynskyy, David Flink, Wei Hai | 2024-02-06 |