Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12066391 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Heath A. Pois, Cornel Bozdog | 2024-08-20 |
| 11906451 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Heath A. Pois, Cornel Bozdog, Alok Vaid | 2024-02-20 |