Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12066391 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Heath A. Pois, Mark Klare | 2024-08-20 |
| 11906451 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Heath A. Pois, Mark Klare, Alok Vaid | 2024-02-20 |
| 11885737 | Method and system for optical characterization of patterned samples | Dror Shafir, Gilad Barak, Shay Wolfling, Michal Haim YACHINI, Matthew Sendelbach | 2024-01-30 |