Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11906451 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Heath A. Pois, Mark Klare, Cornel Bozdog | 2024-02-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11906451 | Method and system for non-destructive metrology of thin layers | Wei Ti Lee, Heath A. Pois, Mark Klare, Cornel Bozdog | 2024-02-20 |