Issued Patents 2023
Showing 1–25 of 41 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11854649 | Temperature-compensated time estimate for a block to reach a uniform charge loss state | Patrick R. Khayat, Steven Michael Kientz, Sivagnanam Parthasarathy, Mustafa N. Kaynak | 2023-12-26 |
| 11847051 | Memory sub-system logical block address remapping | Kishore Kumar Muchherla, Karl D. Schuh, Jiangang Wu, Gil Golov | 2023-12-19 |
| 11841794 | Memory sub-system write sequence track | Karl D. Schuh, Jiangang Wu, Kishore Kumar Muchherla | 2023-12-12 |
| 11837291 | Voltage offset bin selection by die group for memory devices | Mustafa N. Kaynak, Michael Sheperek, Larry J. Koudele, Shane Nowell | 2023-12-05 |
| 11836392 | Relocating data to low latency memory | Kishore Kumar Muchherla, Ashutosh Malshe, Sampath K. Ratnam, Harish Reddy Singidi, Peter Feeley | 2023-12-05 |
| 11810627 | Selective read disturb sampling | Kishore Kumar Muchherla, Harish Reddy Singidi, Renato C. Padilla, Ashutosh Malshe, Sampath K. Ratnam | 2023-11-07 |
| 11810631 | Data integrity checks based on voltage distribution metrics | Michael Sheperek, Christopher M. Smitchger | 2023-11-07 |
| 11797216 | Read calibration based on ranges of program/erase cycles | Giuseppina Puzzilli, Karl D. Schuh, Jeffrey S. McNeil, Kishore Kumar Muchherla, Ashutosh Malshe +1 more | 2023-10-24 |
| 11797205 | Measurement of representative charge loss in a block to determine charge loss state | Patrick R. Khayat, Steven Michael Kientz, Sivagnanam Parthasarathy, Mustafa N. Kaynak | 2023-10-24 |
| 11791000 | Valid translation unit count-based memory management | Ashutosh Malshe, Kishore Kumar Muchherla | 2023-10-17 |
| 11782627 | Read count scaling factor for data integrity scan | Kishore Kumar Muchherla, Ashutosh Malshe, Harish Reddy Singidi, Gianni Stephen Alsasua | 2023-10-10 |
| 11762767 | Storing highly read data at low impact read disturb pages of a memory device | Kishore Kumar Muchherla, Giuseppina Puzzilli, Ashutosh Malshe, James Fitzpatrick, Shyam Sunder Raghunathan +2 more | 2023-09-19 |
| 11756636 | Determining threshold values for voltage distribution metrics | Christopher M. Smitchger | 2023-09-12 |
| 11740957 | Prioritization of error control operations at a memory sub-system | Harish Reddy Singidi, Kishore Kumar Muchherla, Ashutosh Malshe, Xiangang Luo | 2023-08-29 |
| 11733896 | Reliability scan assisted voltage bin selection | Shane Nowell, Michael Sheperek | 2023-08-22 |
| 11726867 | Multi-page parity protection with power loss handling | Harish Reddy Singidi, Kishore Kumar Muchherla, Xiangang Luo, Ashutosh Malshe | 2023-08-15 |
| 11727994 | Performing threshold voltage offset bin selection by package for memory devices | Michael Sheperek, Kishore Kumar Muchherla, Mustafa N. Kaynak, Bruce A. Liikanen, Larry J. Koudele | 2023-08-15 |
| 11726874 | Storing critical data at a memory system | Sivagnanam Parthasarathy, Sampath K. Ratnam, Peter Feeley, Kishore Kumar Muchherla | 2023-08-15 |
| 11726689 | Time-based combining for block families of a memory device | Shane Nowell, Michael Sheperek, Kishore Kumar Muchherla | 2023-08-15 |
| 11720286 | Extended cross-temperature handling in a memory sub-system | Sampath K. Ratnam, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Kishore Kumar Muchherla, Shane Nowell +2 more | 2023-08-08 |
| 11721409 | Smart sampling for block family scan | Shane Nowell, Michael Sheperek, Steven Michael Kientz | 2023-08-08 |
| 11715541 | Workload adaptive scans for memory sub-systems | Renato C. Padilla, Sampath K. Ratnam, Christopher M. Smitchger, Gary F. Besinga, Michael G. Miller +1 more | 2023-08-01 |
| 11715531 | Open block management using storage charge loss margin checking | Christopher M. Smitchger, Gary F. Besinga, Renato C. Padilla, Tawalin Opastrakoon, Sampath K. Ratnam +2 more | 2023-08-01 |
| 11710527 | Mitigating a voltage condition of a memory cell in a memory sub-system | Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam, Sivagnanam Parthasarathy, Qisong Lin +2 more | 2023-07-25 |
| 11704179 | Regression-based calibration and scanning of data units | Harish Reddy Singidi, Ashutosh Malshe, Sampath K. Ratnam, Qisong Lin, Kishore Kumar Muchherla | 2023-07-18 |