| 11853556 |
Combining sets of memory blocks in a memory device |
Larry J. Koudele, Shane Nowell, Michael Sheperek, Bruce A. Liikanen |
2023-12-26 |
| 11854649 |
Temperature-compensated time estimate for a block to reach a uniform charge loss state |
Patrick R. Khayat, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu |
2023-12-26 |
| 11842061 |
Open block family duration limited by temperature variation |
Michael Sheperek, Larry J. Koudele, Bruce A. Liikanen |
2023-12-12 |
| 11797205 |
Measurement of representative charge loss in a block to determine charge loss state |
Patrick R. Khayat, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Vamsi Pavan Rayaprolu |
2023-10-24 |
| 11735254 |
Error avoidance based on voltage distribution parameters of blocks |
Shane Nowell, Michael Sheperek, Mustafa N. Kaynak, Kishore Kumar Muchherla, Larry J. Koudele +1 more |
2023-08-22 |
| 11721409 |
Smart sampling for block family scan |
Vamsi Pavan Rayaprolu, Shane Nowell, Michael Sheperek |
2023-08-08 |
| 11709775 |
Write data for bin resynchronization after power loss |
Michael Sheperek, Bruce A. Liikanen |
2023-07-25 |
| 11705193 |
Error avoidance based on voltage distribution parameters |
Shane Nowell, Michael Sheperek, Mustafa N. Kaynak, Kishore Kumar Muchherla, Larry J. Koudele +1 more |
2023-07-18 |
| 11704217 |
Charge loss scan operation management in memory devices |
Michael Sheperek, Shane Nowell, Mustafa N. Kaynak, Kishore Kumar Muchherla, Larry J. Koudele |
2023-07-18 |
| 11693745 |
Error-handling flows in memory devices based on bins |
Bruce A. Liikanen, Shane Nowell |
2023-07-04 |
| 11675511 |
Associating multiple cursors with block family of memory device |
Michael Sheperek, Bruce A. Liikanen, Peter Feeley, Larry J. Koudele, Shane Nowell |
2023-06-13 |
| 11664080 |
Bin placement according to program-erase cycles |
Michael Sheperek, Mustafa N. Kaynak |
2023-05-30 |
| 11636913 |
Tracking and refreshing state metrics in memory sub-systems |
Michael Sheperek, Bruce A. Liikanen |
2023-04-25 |
| 11604601 |
Trim value loading management in a memory sub-system |
Vamsi Pavan Rayaprolu |
2023-03-14 |
| 11600354 |
Determination of state metrics of memory sub-systems following power events |
Michael Sheperek, Bruce A. Liikanen |
2023-03-07 |
| 11573720 |
Open block family duration limited by time and temperature |
Michael Sheperek, Larry J. Koudele, Bruce A. Liikanen, Kishore Kumar Muchherla |
2023-02-07 |
