HS

Harish Reddy Singidi

Micron: 19 patents #43 of 1,593Top 3%
WT Western Digital Technologies: 2 patents #148 of 737Top 25%
ST Sandisk Technologies: 1 patents #88 of 222Top 40%
Overall (2023): #1,652 of 537,848Top 1%
22
Patents 2023

Issued Patents 2023

Showing 1–22 of 22 patents

Patent #TitleCo-InventorsDate
11854611 Aggressive quick-pass multiphase programming for voltage distribution state separation in non-volatile memory Amiya Banerjee, Shantanu Gupta 2023-12-26
11836392 Relocating data to low latency memory Kishore Kumar Muchherla, Ashutosh Malshe, Vamsi Pavan Rayaprolu, Sampath K. Ratnam, Peter Feeley 2023-12-05
11810627 Selective read disturb sampling Kishore Kumar Muchherla, Renato C. Padilla, Vamsi Pavan Rayaprolu, Ashutosh Malshe, Sampath K. Ratnam 2023-11-07
11782627 Read count scaling factor for data integrity scan Kishore Kumar Muchherla, Ashutosh Malshe, Vamsi Pavan Rayaprolu, Gianni Stephen Alsasua 2023-10-10
11775181 Read error recovery Xiangang Luo, Ting Luo, Kishore Kumar Muchherla 2023-10-03
11776639 Modified distribution of memory device states Amiya Banerjee, Vinayak Bhat 2023-10-03
11740805 Selective relocation of data of a subset of a data block based on distribution of reliability statistics Ashutosh Malshe, Kishore Kumar Muchherla, Vamsi Vamsi Rayaprolu 2023-08-29
11740957 Prioritization of error control operations at a memory sub-system Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla, Ashutosh Malshe, Xiangang Luo 2023-08-29
11735269 Secure erase for data corruption Ting Luo, Kulachet Tanpairoj, Jianmin Huang, Preston A. Thomson, Sebastien Andre Jean 2023-08-22
11726867 Multi-page parity protection with power loss handling Kishore Kumar Muchherla, Xiangang Luo, Vamsi Pavan Rayaprolu, Ashutosh Malshe 2023-08-15
11727996 Dynamic valley searching in solid state drives Amiya Banerjee, Shantanu Gupta 2023-08-15
11709633 Adjusting scan event thresholds to mitigate memory errors Gianni Stephen Alsasua, Peter Feeley, Ashutosh Malshe, Renato C. Padilla, Kishore Kumar Muchherla +1 more 2023-07-25
11704179 Regression-based calibration and scanning of data units Vamsi Pavan Rayaprolu, Ashutosh Malshe, Sampath K. Ratnam, Qisong Lin, Kishore Kumar Muchherla 2023-07-18
11698832 Selective sampling of a data unit during a program erase cycle based on error rate change patterns Ashutosh Malshe, Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla 2023-07-11
11694760 Uncorrectable ECC Jianmin Huang, Deping He, Xiangang Luo, Kulachet Tanpairoj, John Zhang +1 more 2023-07-04
11688473 SLC page read Scott Anthony Stoller, Jung Sheng Hoei, Ashutosh Malshe, Gianni Stephen Alsasua, Kishore Kumar Muchherla 2023-06-27
11682446 Selective wordline scans based on a data state metric Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla, Ashutosh Malshe, Gianni Stephen Alsasua 2023-06-20
11670381 Read voltage calibration based on host IO operations Ashutosh Malshe, Kishore Kumar Muchherla, Peter Feeley, Sampath K. Ratnam, Kulachet Tanpairoj +1 more 2023-06-06
11656931 Selective sampling of a data unit based on program/erase execution time Ashutosh Malshe, Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla 2023-05-23
11610632 NAND temperature data management Kishore Kumar Muchherla, Sampath K. Ratnam, Preston A. Thomson, Jung Sheng Hoei, Peter Feeley +1 more 2023-03-21
11561722 Multi-page parity data storage in a memory device Ashutosh Malshe, Vamsi Pavan Rayaprolu, Kishore Kumar Muchherla 2023-01-24
11544008 Temperature correction in memory sub-systems Gianni Stephen Alsasua, Karl D. Schuh, Ashutosh Malshe, Kishore Kumar Muchherla, Vamsi Pavan Rayaprolu +2 more 2023-01-03