Issued Patents 2023
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11810631 | Data integrity checks based on voltage distribution metrics | Vamsi Pavan Rayaprolu, Michael Sheperek | 2023-11-07 |
| 11756636 | Determining threshold values for voltage distribution metrics | Vamsi Pavan Rayaprolu | 2023-09-12 |
| 11715531 | Open block management using storage charge loss margin checking | Gary F. Besinga, Renato C. Padilla, Tawalin Opastrakoon, Sampath K. Ratnam, Michael G. Miller +2 more | 2023-08-01 |
| 11715541 | Workload adaptive scans for memory sub-systems | Renato C. Padilla, Sampath K. Ratnam, Vamsi Pavan Rayaprolu, Gary F. Besinga, Michael G. Miller +1 more | 2023-08-01 |
| 11687452 | Dynamic program-verify voltage adjustment for intra-block storage charge loss uniformity | Gary F. Besinga, Renato C. Padilla, Tawalin Opastrakoon, Sampath K. Ratnam, Michael G. Miller +2 more | 2023-06-27 |