Issued Patents 2022
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11507829 | Greedy approach for obtaining an artificial intelligence model in a parallel configuration | Yinbo Shi, Yequn Zhang, Bowei Liu | 2022-11-22 |
| 11475298 | Using quantization in training an artificial intelligence model in a semiconductor solution | Yongxiong Ren, Yi Fan, Yequn Zhang, Baohua Sun, Bin Yang +1 more | 2022-10-18 |
| 11431976 | System and method for inspection using tensor decomposition and singular value decomposition | Nurmohammed Patwary, Richard Wallingford, James A. Smith, Vladimir Tumakov, Bjorn Brauer | 2022-08-30 |
| 11406121 | Method of smart rice cookers capable of mixed grain cooking and abnormal conditions detection | Dongyan Wang, Linnan Zhu, Junyang Zhou | 2022-08-09 |
| 11389902 | Reducing surface asperities | Venkata Madhukanth Vadali, Chao Ma, Neil Arthur Duffie, Frank Ewald Pfefferkorn | 2022-07-19 |
| 11340116 | Optical gradation system and method | Yang Yang, Xinyang Liu, Huihui Huang | 2022-05-24 |
| 11335045 | Combining feature maps in an artificial intelligence semiconductor solution | Bin Yang, Lin Yang, Yequn Zhang, Yongxiong Ren, Yinbo Shi +1 more | 2022-05-17 |
| 11328435 | Image alignment setup for specimens with intra- and inter-specimen variations using unsupervised learning and adaptive database generation methods | Bjorn Brauer, Huan Jin | 2022-05-10 |
| 11328411 | Print check repeater defect detection | Hong Chen, Kenong Wu, James A. Smith, Eugene Shifrin, Qing Luo +7 more | 2022-05-10 |
| 11308606 | Design-assisted inspection for DRAM and 3D NAND devices | Junqing Huang, Hucheng Lee, Sangbong Park | 2022-04-19 |
| 11270430 | Wafer inspection using difference images | Abdurrahman Sezginer, Pavan Kumar, Junqing Huang, Lisheng Gao, Grace Hsiu-Ling Chen +2 more | 2022-03-08 |
| D944345 | Dumbbell bench | — | 2022-02-22 |
| D940799 | Strength training dip stand | — | 2022-01-11 |