Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11431976 | System and method for inspection using tensor decomposition and singular value decomposition | Nurmohammed Patwary, James A. Smith, Xiaochun Li, Vladimir Tumakov, Bjorn Brauer | 2022-08-30 |
| 11330164 | Determining focus settings for specimen scans | Bryant Mantiply, Xiumei Liu, Matthew Giusti, Kai Cao | 2022-05-10 |
| 11295438 | Method and system for mixed mode wafer inspection | Jason Z. Lin, Allen Park, Ellis Chang, Songnian Rong, Chetana Bhaskar | 2022-04-05 |