Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11348222 | Methods and systems for inspection of wafers and reticles using designer intent data | Paul Frank Marella, Sharon McCauley, William Volk, James Wiley, Sterling Watson +2 more | 2022-05-31 |
| 11295438 | Method and system for mixed mode wafer inspection | Jason Z. Lin, Allen Park, Richard Wallingford, Songnian Rong, Chetana Bhaskar | 2022-04-05 |