Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11348222 | Methods and systems for inspection of wafers and reticles using designer intent data | Paul Frank Marella, Ellis Chang, William Volk, James Wiley, Sterling Watson +2 more | 2022-05-31 |