Issued Patents 2022
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11431976 | System and method for inspection using tensor decomposition and singular value decomposition | Nurmohammed Patwary, Richard Wallingford, James A. Smith, Xiaochun Li, Vladimir Tumakov | 2022-08-30 |
| 11415531 | Statistical learning-based mode selection for multi-mode inspection | Vaibhav Gaind | 2022-08-16 |
| 11416982 | Controlling a process for inspection of a specimen | Hucheng Lee, Sangbong Park | 2022-08-16 |
| 11328410 | Deep generative models for optical or other mode selection | — | 2022-05-10 |
| 11328411 | Print check repeater defect detection | Hong Chen, Kenong Wu, Xiaochun Li, James A. Smith, Eugene Shifrin +7 more | 2022-05-10 |
| 11328435 | Image alignment setup for specimens with intra- and inter-specimen variations using unsupervised learning and adaptive database generation methods | Huan Jin, Xiaochun Li | 2022-05-10 |