Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11416982 | Controlling a process for inspection of a specimen | Bjorn Brauer, Sangbong Park | 2022-08-16 |
| 11308606 | Design-assisted inspection for DRAM and 3D NAND devices | Junqing Huang, Sangbong Park, Xiaochun Li | 2022-04-19 |
| 11244442 | Method and system for correlating optical images with scanning electron microscopy images | Lisheng Gao, Jan Lauber, Yong Zhang | 2022-02-08 |