Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11308606 | Design-assisted inspection for DRAM and 3D NAND devices | Hucheng Lee, Sangbong Park, Xiaochun Li | 2022-04-19 |
| 11270430 | Wafer inspection using difference images | Abdurrahman Sezginer, Xiaochun Li, Pavan Kumar, Lisheng Gao, Grace Hsiu-Ling Chen +2 more | 2022-03-08 |