Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11270430 | Wafer inspection using difference images | Abdurrahman Sezginer, Xiaochun Li, Pavan Kumar, Junqing Huang, Grace Hsiu-Ling Chen +2 more | 2022-03-08 |
| 11244442 | Method and system for correlating optical images with scanning electron microscopy images | Hucheng Lee, Jan Lauber, Yong Zhang | 2022-02-08 |