Issued Patents 2021
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11205119 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Idan Kaizerman, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2021-12-21 |
| 11199506 | Generating a training set usable for examination of a semiconductor specimen | Ohad Shaubi, Assaf Asbag | 2021-12-14 |
| 11151706 | Method of classifying defects in a semiconductor specimen and system thereof | Kirill Savchenko, Assaf Asbag | 2021-10-19 |
| 11151710 | Automatic selection of algorithmic modules for examination of a specimen | Ran Schleyen, Eyal Zakkay | 2021-10-19 |
| 11138507 | System, method and computer program product for classifying a multiplicity of items | Assaf Asbag | 2021-10-05 |
| 11037286 | Method of classifying defects in a semiconductor specimen and system thereof | Assaf Asbag, Ohad Shaubi, Kirill Savchenko, Shiran Gan-Or, Zeev Zohar | 2021-06-15 |
| 11010665 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Idan Kaizerman, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2021-05-18 |
| 10921334 | System, method and computer program product for classifying defects | Kirill Savchenko, Assaf Asbag | 2021-02-16 |