Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11205119 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2021-12-21 |
| 11176417 | Method and system for producing digital image features | Amit Aides, Amit Alfassy, Joseph Shtok | 2021-11-16 |
| 11010665 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2021-05-18 |