Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11205119 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Daniel Ravid +1 more | 2021-12-21 |
| 11010665 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Daniel Ravid +1 more | 2021-05-18 |
| 10928437 | Method of inspecting a specimen and system thereof | Zvi Goren, Adi Boehm | 2021-02-23 |
| 10902620 | Registration between an image of an object and a description | Shaul Cohen, Lavi Jacov Shachar | 2021-01-26 |