Issued Patents 2021
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11205119 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2021-12-21 |
| 11080736 | Adaptive in-application physical product offers | — | 2021-08-03 |
| 11010665 | Method of deep learning-based examination of a semiconductor specimen and system thereof | Leonid Karlinsky, Boaz Cohen, Efrat Rosenman, Amit Batikoff, Daniel Ravid +1 more | 2021-05-18 |
| 10901402 | Closed-loop automatic defect inspection and classification | Gadi Greenberg, Zeev Zohar | 2021-01-26 |
| 10896574 | System and method for outlier detection in gaming | — | 2021-01-19 |