Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11037286 | Method of classifying defects in a semiconductor specimen and system thereof | Assaf Asbag, Ohad Shaubi, Kirill Savchenko, Shiran Gan-Or, Boaz Cohen | 2021-06-15 |
| 10901402 | Closed-loop automatic defect inspection and classification | Gadi Greenberg, Idan Kaizerman | 2021-01-26 |