Issued Patents 2021
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11199506 | Generating a training set usable for examination of a semiconductor specimen | Ohad Shaubi, Boaz Cohen | 2021-12-14 |
| 11151706 | Method of classifying defects in a semiconductor specimen and system thereof | Kirill Savchenko, Boaz Cohen | 2021-10-19 |
| 11138507 | System, method and computer program product for classifying a multiplicity of items | Boaz Cohen | 2021-10-05 |
| 11037286 | Method of classifying defects in a semiconductor specimen and system thereof | Ohad Shaubi, Kirill Savchenko, Shiran Gan-Or, Boaz Cohen, Zeev Zohar | 2021-06-15 |
| 10921334 | System, method and computer program product for classifying defects | Kirill Savchenko, Boaz Cohen | 2021-02-16 |