Issued Patents 2021
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11037286 | Method of classifying defects in a semiconductor specimen and system thereof | Assaf Asbag, Ohad Shaubi, Kirill Savchenko, Boaz Cohen, Zeev Zohar | 2021-06-15 |
SG
Shiran Gan-Or
Overall (2021): #264,621 of 548,734Top 50%
1
Patents 2021