Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11199506 | Generating a training set usable for examination of a semiconductor specimen | Assaf Asbag, Boaz Cohen | 2021-12-14 |
| 11037286 | Method of classifying defects in a semiconductor specimen and system thereof | Assaf Asbag, Kirill Savchenko, Shiran Gan-Or, Boaz Cohen, Zeev Zohar | 2021-06-15 |