Issued Patents 2021
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11210982 | Method and device for Mura defect repair | Li Qin, Zhao Liu | 2021-12-28 |
| 11081029 | Method for evaluating brightness measurement accuracy of Demura equipment | Xiaofan Feng, Zhao Liu, Erwei Ma, Hongjun Wu, Ronghua Liu +1 more | 2021-08-03 |