Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10831108 | Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology | Tal Marciano, Barak Bringoltz, Evgeni Gurevich, Ido Adam, Ze'ev Lindenfeld +17 more | 2020-11-10 |
| 10824082 | Estimation of asymmetric aberrations | Vladimir Levinski | 2020-11-03 |
| 10754261 | Reticle optimization algorithms and optimal target design | Vladimir Levinski | 2020-08-25 |
| 10591406 | Symmetric target design in scatterometry overlay metrology | Barak Bringoltz, Daniel Kandel, Noam Sapiens, Paykin Irina, Alexander Svizher +4 more | 2020-03-17 |