Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10832396 | And noise based care areas | Brian Duffy, Santosh Bhattacharyya, Gordon Rouse, Chris Maher, Erfan Soltanmohammadi | 2020-11-10 |
| 10699926 | Identifying nuisances and defects of interest in defects detected on a wafer | Brian Duffy, Mike VonDenHoff, Andrew Cross, Kaushik Sah, Antonio Mani | 2020-06-30 |
| 10692690 | Care areas for improved electron beam defect detection | Vidyasagar Anantha, Arpit Yati, Saravanan Paramasivam, Jincheng Lin | 2020-06-23 |
| 10670536 | Mode selection for inspection | Saravanan Paramasivam, Ankit Jain, Prasanti Uppaluri, Raghavan Konuru | 2020-06-02 |