Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10818001 | Using stochastic failure metrics in semiconductor manufacturing | Wing-Shan Ribi Leung, Allen Park, Andrew Cross | 2020-10-27 |
| 10699926 | Identifying nuisances and defects of interest in defects detected on a wafer | Martin Plihal, Brian Duffy, Mike VonDenHoff, Andrew Cross, Antonio Mani | 2020-06-30 |
| 10598617 | Metrology guided inspection sample shaping of optical inspection results | Andrew Cross, Antonio Mani | 2020-03-24 |
| 10540759 | Bonded wafer metrology | Thomas Krah, Shifang Li, Heiko Eisenbach, Moritz Stoerring | 2020-01-21 |