Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10699926 | Identifying nuisances and defects of interest in defects detected on a wafer | Martin Plihal, Brian Duffy, Mike VonDenHoff, Andrew Cross, Kaushik Sah | 2020-06-30 |
| 10598617 | Metrology guided inspection sample shaping of optical inspection results | Kaushik Sah, Andrew Cross | 2020-03-24 |