MV

Mike VonDenHoff

KL Kla-Tencor: 1 patents #130 of 345Top 40%
Overall (2020): #340,411 of 565,922Top 65%
1
Patents 2020

Issued Patents 2020

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10699926 Identifying nuisances and defects of interest in defects detected on a wafer Martin Plihal, Brian Duffy, Andrew Cross, Kaushik Sah, Antonio Mani 2020-06-30