Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10818001 | Using stochastic failure metrics in semiconductor manufacturing | Wing-Shan Ribi Leung, Kaushik Sah, Andrew Cross | 2020-10-27 |
| 10796065 | Hybrid design layout to identify optical proximity correction-related systematic defects | Ankit Jain | 2020-10-06 |
| 10740888 | Computer assisted weak pattern detection and quantification system | Naoshin Haque, Ajay Gupta | 2020-08-11 |