Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10692690 | Care areas for improved electron beam defect detection | Arpit Yati, Saravanan Paramasivam, Martin Plihal, Jincheng Lin | 2020-06-23 |
| 10620134 | Creating defect samples for array regions | Manikandan Mariyappan, Raghav Babulnath, Gangadharan Sivaraman, Satya Kurada, Thirupurasundari Jayaraman +2 more | 2020-04-14 |