Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10706522 | System and method for generation of wafer inspection critical areas | Rajesh Manepalli, Ashok Kulkarni, Saibal Banerjee, John Kirkland | 2020-07-07 |
| 10670536 | Mode selection for inspection | Martin Plihal, Saravanan Paramasivam, Ankit Jain, Raghavan Konuru | 2020-06-02 |
| 10620134 | Creating defect samples for array regions | Vidyasagar Anantha, Manikandan Mariyappan, Raghav Babulnath, Gangadharan Sivaraman, Satya Kurada +2 more | 2020-04-14 |