Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10714366 | Shape metric based scoring of wafer locations | Jagdish Chandra Saraswatula | 2020-07-14 |
| 10706522 | System and method for generation of wafer inspection critical areas | Prasanti Uppaluri, Rajesh Manepalli, Ashok Kulkarni, John Kirkland | 2020-07-07 |