Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10706522 | System and method for generation of wafer inspection critical areas | Prasanti Uppaluri, Ashok Kulkarni, Saibal Banerjee, John Kirkland | 2020-07-07 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10706522 | System and method for generation of wafer inspection critical areas | Prasanti Uppaluri, Ashok Kulkarni, Saibal Banerjee, John Kirkland | 2020-07-07 |