SH

Stefan Hunsche

AB Asml Netherlands B.V.: 6 patents #31 of 801Top 4%
🗺 California: #3,376 of 68,989 inventorsTop 5%
Overall (2020): #22,234 of 565,922Top 4%
6
Patents 2020

Issued Patents 2020

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
10859926 Methods for defect validation Rafael Aldana Laso, Vivek Jain, Marinus Jochemsen, Xinjian Zhou 2020-12-08
10852646 Displacement based overlay or alignment Marinus Jochemsen, Scott Anderson Middlebrooks, Te-Sheng WANG 2020-12-01
10761432 Inspection apparatus and methods, substrates having metrology targets, lithographic system and device manufacturing method Simon Gijsbert Josephus Mathijssen, Markus Gerardus Martinus Maria Van Kraaij 2020-09-01
10732513 Method and apparatus for image analysis Scott Anderson Middlebrooks, Markus Gerardus Martinus Maria Van Kraaij, Adrianus Cornelis Matheus Koopman, Willem Marie Julia Marcel Coene 2020-08-04
10712672 Method of predicting patterning defects caused by overlay error Marinus Jochemsen, Wim Tjibbo Tel 2020-07-14
10607334 Method and apparatus for image analysis Scott Anderson Middlebrooks, Markus Gerardus Martinus Maria Van Kraaij, Maxim PISARENCO, Adrianus Cornelis Matheus Koopman, Willem Marie Julia Marcel Coene 2020-03-31