Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10816909 | Metrology system and method for determining a characteristic of one or more structures on a substrate | Patricius Aloysius Jacobus Tinnemans, Arie Jeffrey Den Boef, Armand Eugene Albert Koolen, Nitesh Pandey, Vasco Tomas Tenner +1 more | 2020-10-27 |
| 10732513 | Method and apparatus for image analysis | Scott Anderson Middlebrooks, Markus Gerardus Martinus Maria Van Kraaij, Adrianus Cornelis Matheus Koopman, Stefan Hunsche | 2020-08-04 |
| 10607334 | Method and apparatus for image analysis | Scott Anderson Middlebrooks, Markus Gerardus Martinus Maria Van Kraaij, Maxim PISARENCO, Adrianus Cornelis Matheus Koopman, Stefan Hunsche | 2020-03-31 |
| 10585363 | Alignment system | Simon Gijsbert Josephus Mathijssen, Arie Jeffrey Den Boef, Alessandro Polo, Patricius Aloysius Jacobus Tinnemans, Adrianus Johannes Hendrikus Schellekens +3 more | 2020-03-10 |