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Magnetic tunnel junction with low series resistance |
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| 10746782 |
Accelerated wafer testing using non-destructive and localized stress |
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| 10739397 |
Accelerated wafer testing using non-destructive and localized stress |
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Ring oscillator structures to determine local voltage value |
Keith A. Jenkins, Peilin Song, Franco Stellari |
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| 10552278 |
Non-destructive analysis to determine use history of processor |
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2020-02-04 |
