| 10755397 |
Automated focusing of a microscope of an optical inspection system |
Chung-Ching Lin, Peilin Song |
2020-08-25 |
| 10755404 |
Integrated circuit defect detection using pattern images |
Chung-Ching Lin, Thomas M. Shaw, Peilin Song, Thomas A. Wassick |
2020-08-25 |
| 10591539 |
Automated scan chain diagnostics using emission |
Peilin Song |
2020-03-17 |
| 10574240 |
Ring oscillator structures to determine local voltage value |
Keith A. Jenkins, Peilin Song, James H. Stathis |
2020-02-25 |
| 10571520 |
Scan chain latch design that improves testability of integrated circuits |
Dzmitry S. Maliuk, Alan J. Weger, Peilin Song |
2020-02-25 |
| 10564213 |
Dielectric breakdown monitor |
Tam N. Huynh, Keith A. Jenkins |
2020-02-18 |
| 10552278 |
Non-destructive analysis to determine use history of processor |
Keith A. Jenkins, Barry P. Linder, Emily A. Ray, Raphael P. Robertazzi, Peilin Song +4 more |
2020-02-04 |
