Issued Patents 2020
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10782336 | BTI degradation test circuit | Barry P. Linder | 2020-09-22 |
| 10746785 | Dynamic predictor of semiconductor lifetime limits | Chen-Yong Cher, Barry P. Linder | 2020-08-18 |
| 10739391 | Duty cycle measurement | — | 2020-08-11 |
| 10671958 | Analytics to determine customer satisfaction | Karthik Balakrishnan, Barry P. Linder | 2020-06-02 |
| 10574240 | Ring oscillator structures to determine local voltage value | Peilin Song, James H. Stathis, Franco Stellari | 2020-02-25 |
| 10564213 | Dielectric breakdown monitor | Tam N. Huynh, Franco Stellari | 2020-02-18 |
| 10552278 | Non-destructive analysis to determine use history of processor | Barry P. Linder, Emily A. Ray, Raphael P. Robertazzi, Peilin Song, James H. Stathis +4 more | 2020-02-04 |