Issued Patents 2020
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10571520 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Franco Stellari, Peilin Song | 2020-02-25 |
| 10552278 | Non-destructive analysis to determine use history of processor | Keith A. Jenkins, Barry P. Linder, Emily A. Ray, Raphael P. Robertazzi, Peilin Song +4 more | 2020-02-04 |