Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10571520 | Scan chain latch design that improves testability of integrated circuits | Franco Stellari, Alan J. Weger, Peilin Song | 2020-02-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10571520 | Scan chain latch design that improves testability of integrated circuits | Franco Stellari, Alan J. Weger, Peilin Song | 2020-02-25 |